Quantum engineers have spent years trying to tame the fragility of qubits, only to be thwarted by the tiniest imperfections ...
Understanding how dislocations (line defects in the crystal structure) occur when 3D-printing metals has been unclear to materials scientists. Understanding when and how dislocations form in ...
(Nanowerk News) An international team of researchers, led by Professor Yu Zou (MSE), is using electric fields to control the motion of material defects. This work has important implications for ...
SiC is extensively used in microelectronic devices owing to its several unique properties. However, low yield and high cost of the SiC manufacturing process are the major challenges that must be ...
Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...