Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...
The novel method uses the YOLOv8 framework, integrating an attention mechanism and a transformer model. It was tested on a dataset of 4,500 electroluminescence images against several other models and ...
Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
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