First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...
PI (Physik Instrumente), a global leader in piezo nanopositioning and air bearing technology, offers the P-733 XYZ piezo ...
Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...
Invented in 1986 atomic force microscopy (AFM) has become a valuable tool for life scientists, offering the ability to image aqueous biological samples, like membranes, at nanometer resolution. The ...
SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research announced today the release of the new Vero VRS1250 Atomic Force Microscope (AFM), which enables video-rate imaging with line ...
The Semilab AFM-1000 is a state-of-the-art tabletop atomic force microscope designed to deliver high-resolution, sub-atomic, precise measurements with an extremely low noise level. It enables highly ...
SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research today announces the release of AR Maps, a new and powerful data analysis software package for the Jupiter XR atomic force ...
Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...
Ultra-fast, in-line atomic force microscope (AFM), the Metron®3D, goes online for advanced DRAM manufacturing at SK hynix in Korea The Metron®3D is able to generate images at speeds 10× that of a ...
Park Systems, a leading global manufacturer of atomic force microscopy (AFM) and nanoscale metrology systems, today announced ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results