Power management in contemporary system-on-chip (SoC) designs is almost unimaginably complex. Processors and other chip cores turn on and off as needed. Advanced features such as dynamic voltage and ...

With Design-For-Test (DFT), test coverage is the typical yardstick used to gauge the quality of the manufacturing tests being performed. But as next-generation designs become more complex, traditional ...

With the acceleration of Internet of Things (IoT) devices and the proliferation of RF and wireless products, there is a growing need for RF measurement expertise and affordable RF test instrumentation ...