A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...

PFM is based on the converse piezoelectric effect, where an applied electric field induces mechanical strain in piezoelectric materials. In PFM, an AC voltage is applied between a conductive atomic ...

Electrostatic Force Microscopy (EFM) and dielectric characterisation have emerged as pivotal techniques in the exploration of nanoscale phenomena, enabling researchers to probe the electrical ...

Microscopy continues to transform the life sciences. Here are five recent breakthroughs made possible by the technique.

The introduction of electrical Atomic Force Microscopy (AFM) modes has transformed the field of nanoscale analysis. These methods have unlocked novel opportunities for measuring electrical properties ...

What is Scanning Microwave Microscopy? Scanning microwave microscopy (SMM) is a powerful imaging technique that combines the principles of atomic force microscopy (AFM) and microwave technology to ...

FA engineers are expected to produce accurate results. Thus, there is no room for error when it comes to the data provided by instruments. Due to its data precision ...

Researchers at Oak Ridge National Laboratory used specialized tools to study materials at the atomic scale and analyze ...

Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

An atomic force microscope tip writes data in stable ferroelectric structures, enabling reliable multistate storage at ...