This new technical paper titled “End-to-end deep learning framework for printed circuit board manufacturing defect classification” is from researchers at École de technologie supérieure (ÉTS) in ...
Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...
In the final article of a four-part series on binary classification using PyTorch, Dr. James McCaffrey of Microsoft Research shows how to evaluate the accuracy of a trained model, save a model to file ...
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